Commit: 0d436295e3460674847bfa7717630b5c8939b4b8
Parent: e2c06add317635365a5e816ace40766a4b23ecfd
Author: Gowtham Anandha Babu <gowtham.ab@samsung.com>
Committer: Luiz Augusto von Dentz <luiz.von.dentz@intel.com>
Date: 2015-02-10 13:16:37
Tree: 5124af003e83ff2dca7b1159aaf4ccff8a844111

unit/test-gatt: Fix duplicate test case number TP/GAR/CL/BI-22-C was duplicated as TP/GAR/CL/BI-21-C.

Diffstat

M unit/test-gatt.c | 2 +-

1 files changed, 1 insertions(+), 1 deletions(-)

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